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Facilities |
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Selected Instruments at MCEE Materials Processing/Manufacturing and Preparation SLM 125HL Selective Laser Melting / Powder Bed Fusion Additive Manufacturing System DYIF Gas Atomization System with Induction Melting Furnace (50KW – 1650ºC) Centorr 5BJ Arc Melting Furnace with Drop-Cast Capability Pascal Technologies Vacuum System with Hydrogen Flush for Diffusion Couple Assembly Struer RotoPol-11 and RotoForce Specimen Preparation System Allied High Tech M-Prep 3 Grinding/Polishing Machine Buehler Isomet Low Speed Saw (2) Allied High Tech Low Speed Saw Ar-Atmosphere Glovebox for Handling of Rare Earth Metals and Alloys Heat Treatment CM 1710 Rapid High Temperature (1700ºC) Furnace with Vertical Cycling Capability Thermolyne 46100 Programmable High Temperature (1700ºC) Muffle Furnace Lindberg/3M 3-Zone Tube Furnaces (3) with Independent Controllers (1100ºC) Thermolyne Single Zone Tube Furnace (1500ºC) for High Temperature / Environmental Control with In-House Built Thermotransport Rig (Temperature Gradient Testing) Fisher Scientific Isotemp Programmable Furnace (1000ºC) 2 Paragon BlueBird Kilns/Furnaces (650ºC) Materials Analysis and Characterization Hysitron PI Premium Nano-Indentor System with Wear and Scratch Testing Capability Beckman-Coulter LS 13 320 Laser Diffraction Particle Size Analyzer Electrochemical Impedance Spectrometer - IM6e BAS Zahner Impedance System Perkin-Elmer Pyris 1 Differential Scanning Calorimeter (DSC) Perkin-Elmer Thermal Gravimetric Analyzer (TGA) 7 Perkin-Elmer Dynamic Mechanical Analyzer (DMA) 7e Perkin-Elmer Differential Temperature Analyzer (DTA) 7 TA Instrument SDT 2960 Simultaneous DSC/TGA Nikon Optical Microscope with Nomalski Capability and Nikon Optical Streoscope (Digital Image Capturing and Processing) SUN and Macintosh Workstations Computation and Programming (Python, C/C++/Fortran) Materials Characterization Facility (MCF) at University of Central Florida Website - http://www.ampac.ucf.edu/facilities/MCF.php FEI Tecnai 30 Transmission Electron Microscope / Scanning Transmission Electron Microscope (BF, DF, HAADF, EDS, EELS) ZEISS Ultra-55 Field Emission Scanning Electron Microscope (SE, BSE, EDS, STEM, Electron Lithography) ZEISS 1540 CrossBeam Focused Ion Beam and Field Emission Scanning Electron Microscope (SE, BSE, EDS) FEI 200TEM Focused Ion Beam JEOL JSM-6480LV Scanning Electron Microscope (SE, BSE, EDS, EBSD) JEOL 1100B Transmission Electron Microscope (BF, DF, EDS) PanAnalytical X-ray Diffractometers with a Variety of Temperature and Environmental Controls Olympus LEXT OLS 3000 Confocal Scanning Microscope CAMECA IMS-3F Secondary Ion Mass Spectroscope PHI Adept 1010 Dynamic Secondary Ion Mass Spectroscope Physica Electronics 600 Scanning Auger Spectroscope Physica Electronics 5400 X-ray Photoluminescence Spectroscope General Ionix 1.7MU Tandetron Rutherford Backscatter Spectroscope |
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