Dr. Jiang’s group conducts highly interdisciplinary research encompassing fundamental materials science, reliability metrology, advanced interconnect and packaging systems, and nanotechnology. Two research directions are currently being pursued. The first direction is to investigate the fundamental failure physics and mechanisms degrading the reliability of micro-/nano-electronics systems by combining advanced characterization techniques with modeling and accelerated testing. This area of research seeks basic understanding to optimize materials and processing for better device reliability and faster product development. The second area of research is focused on fabrication and characterization of novel nanomaterials and nanostructures. The aim is to develop electronics, energy storage, biomedical, and health care applications by exploring the unique properties of these materials and structures.

Open Positions

  • We are currently seeking motivated undergraduate students to join our lab. If interested, please send your CV to tengfei.jiang@ucf.edu.
  • We always welcome visiting scholars to join our group.