Selected Instruments in Our Lab (24-7 Access)
Materials Processing/Manufacturing Capability
SLM 125HL Selective Laser Melting / Powder Bed Fusion Additive Manufacturing System
DYIF Gas Atomization System with Induction Melting Furnace (50KW – 1650ºC)
Centorr 5BJ Arc Melting Furnace with Drop-Cast Capability
Pascal Technologies Vacuum System with Hydrogen Flush for Diffusion Couple Assembly
Struer RotoPol-11 and RotoForce Specimen Preparation System
Allied High Tech M-Prep 3 Grinding/Polishing Machine
Buehler Isomet Low Speed Saw (2)
Allied High Tech Low Speed Saw
Ar-Atmosphere Glovebox for Handling of Rare Earth Metals and Alloys
Heat Treatment Capability
CM 1710 Rapid High Temperature (1700ºC) Furnace with Vertical Cycling Capability
Thermolyne 46100 Programmable High Temperature (1700ºC) Muffle Furnace
Lindberg/3M 3-Zone Tube Furnaces (3) with Independent Controllers (1100ºC)
Thermolyne Single Zone Tube Furnace (1500ºC) for High Temperature / Environmental Control with In-House Built Thermotransport Rig (Temperature Gradient Testing)
Fisher Scientific Isotemp Programmable Furnace (1000ºC)
2 Paragon BlueBird Kilns/Furnaces (650ºC)
Materials Analysis and Characterization Capability
Hysitron PI Premium Nano-Indentor System with Wear and Scratch Testing Capability
Beckman-Coulter LS 13 320 Laser Diffraction Particle Size Analyzer
TA Instrument SDT 2960 Simultaneous DSC/TGA
Nikon Optical Microscope with Nomalski Capability and Nikon Optical Streoscope (Digital Image Capturing and Processing)
Materials Characterization Facility @ University of Central Florida
FEI Tecnai 30 Transmission Electron Microscope / Scanning Transmission Electron Microscope (BF, DF, HAADF, EDS, EELS)
ZEISS Ultra-55 Field Emission Scanning Electron Microscope (SE, BSE, EDS, STEM, Electron Lithography)
ZEISS 1540 CrossBeam Focused Ion Beam and Field Emission Scanning Electron Microscope (SE, BSE, EDS)
FEI 200TEM Focused Ion Beam
JEOL JSM-6480LV Scanning Electron Microscope (SE, BSE, EDS, EBSD)
JEOL 1100B Transmission Electron Microscope (BF, DF, EDS)
PanAnalytical X-ray Diffractometers with a Variety of Temperature and Environmental Controls
Olympus LEXT OLS 3000 Confocal Scanning Microscope
CAMECA IMS-3F Secondary Ion Mass Spectroscope
PHI Adept 1010 Dynamic Secondary Ion Mass Spectroscope
Physica Electronics 600 Scanning Auger Spectroscope
Physica Electronics 5400 X-ray Photoluminescence Spectroscope